DATS3310 PCB tester

DATS3310 is a high Speed In-Circuit Functional Tester. This tester can do in-circuit test on all digital logic devices working between +/-12V. All TTL & CMOS devices ranging from simple gates to Counters, latches, flip-flops, multiplexers & demulti plexers, memory devices like PAL, RAMS, EPROMs and certain LSI chips can be tested effectively using this test systems. Even analog devices like Op-amps, Comparators, ADCs, DACs can also be tested. DATS 3310 has a 2 channel VI trace comparison method for testing all the passive devices on the board in comparison with a Good Working Board. This test system comes with a maximum of 32 pins.

Features

  • High Speed In-Circuit functional tester
  • Affordable and easy to use
  • Functional tests for devices both In-Circuit and Out-Circuit
  • Out Circuit devices self Powered
  • Capable of testing Digital and Analog devices
  • VI trace for live comparison of good & faulty PCBs
  • Includes Loop test, Identity, Contact test & voltage test
  • USB 2.0 interface
  • Windows 8 operating system software
  • Extensive device test library
  • Can be interfaced to DIP, SOIC, QFP, PLCC test clips for testing various device packages
  • Logic’s supported: TTL, CMOS, 12VCMOS, ECL, EIA, 3.3V
  • Graphical waveform display with clear PASS/FAIL information
  • Pin info window for DUT pinout
  • Test rates Programmable in steps. Max test rate 1MHz
  • Pull UP/DOWN options for testing OC/OE devices
  • Built-in BUT power supply of +/-5V and +/-12V
  • Auto power ON/OFF during test